https://doi.org/10.51514/JSTR.8.2.2026.1-8
Komal Teotia, Yogesh Kumar, Arvind Kumar, Mohsin Khan and A.P. Singh
In this work, we present the thermal reduction of graphene oxide to improve the quality of re-duced graphene oxide synthesized using the modified Hummer’s method. Various experimental techniques were employed to characterize the materials including X-ray diffraction, Raman spectroscopy, Fourier-transform infrared spectroscopy, scanning electron microscopy (SEM) and Transmission electron microscopy (TEM). The obtained results demonstrate that thermal reduction is significantly improved the quality of reduced graphene oxide by enhancing the removal of oxygen-containing groups, restoring the graphitic structure, and minimizing defects. X-ray diffraction analysis confirmed the reduction of interlayer spacing, while Fourier-transform infrared spectroscopy (FTIR) demonstrated the successful elimination of hydroxyl, epoxy, and carboxyl groups. Raman spectroscopy showed a notable reduction in the intensity ratio of the D-band to the G-band, indicating effective defect healing. Morphological and structural analysis of the obtained materials indicates that the synthesis and reduction to produce reduced graphene oxide are effective. The analysis validates the successful synthesis of reduced graphene oxide with enhanced quality under controlled thermal reduction at 360°C and provides a strategy for the reliable production of reduced graphene oxide for various electronic applications.
Keywords: Graphene oxide, Reduced graphene oxide, Exfoliation, FTIR, Raman spectroscopy etc.